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The system offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option, Scan Test Option, RFID Option, Redundancy Analysis and APMU. The system offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option, Scan Test Option, RFID Option, Redundancy Analysis and APMU. The system offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option, Scan Test Option, RFID Option, Redundancy Analysis and APMU. |
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APMU