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BIST |
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Teradyne's Test Assistance Group (TAG) and LogicVision jointly engineered the new software interface that enables users easy access to LogicVision's embedded memory and logic built-in self-test (BIST) device structures. 0, the Mentor DFT line-up provides an entire flow that offers effective scan testing, test pattern compression, memory built-in self-test (BIST), and failure diagnosis. Mentor Graphics provides the industry's broadest portfolio of DFT solutions for today's System-on-Chip and deep submicron designs, including integrated solutions for scan, ATPG, EDT, advanced memory test, boundary scan, logic built-in self-test and a variety of DFT-related flows. |
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