CD-SEM - What does CD-SEM stand for? Acronyms and abbreviations by the Free Online Dictionary.

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Acronym	Definition
CD-SEM	Critical Dimension - Scanning Electron Microscopy

? References in periodicals archive
CD-SEM images of linewidth test patterns were analyzed to determine the lines' widths and the angles of their edges. CD-SEM shape-sensitive linewidth measurement final report submitted by Journal of Research of the National Institute of Standards and Technology Brion and HHT, the world's largest supplier of scanning electron microscopes for critical dimension (CD) measurement, are working with a joint customer, a large semiconductor manufacturer, to develop a common interface that works with Brion's Tachyon[TM] lithography simulation and design inspection tool and HHT's new DesignGauge CD-SEM system. Brion, Hitachi High-Technologies Collaborate on Common DFM Platform by Business Wire This CD-SEM incorporates a "beam condition" monitor that provides numerical and graphical descriptions of the condition of the instrument and documents the instruments condition over time. Newest critical dimension scanning electron microscopes use NIST ... by Journal of Research of the National Institute of Standards and Technology More results

CD-SEM images of linewidth test patterns were analyzed to determine the lines' widths and the angles of their edges.

CD-SEM shape-sensitive linewidth measurement final report submitted by Journal of Research of the National Institute of Standards and Technology

Brion and HHT, the world's largest supplier of scanning electron microscopes for critical dimension (CD) measurement, are working with a joint customer, a large semiconductor manufacturer, to develop a common interface that works with Brion's Tachyon[TM] lithography simulation and design inspection tool and HHT's new DesignGauge CD-SEM system.

Brion, Hitachi High-Technologies Collaborate on Common DFM Platform by Business Wire

This CD-SEM incorporates a "beam condition" monitor that provides numerical and graphical descriptions of the condition of the instrument and documents the instruments condition over time.

Newest critical dimension scanning electron microscopes use NIST ... by Journal of Research of the National Institute of Standards and Technology

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