CDSEMCenter for Doctoral Studies in Economics and Management (Germany; University of Mannheim)
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Schlumberger Verification Systems recently introduced the revolutionary Yosemite(TM) Ultra Low Voltage(TM) CDSEM and supplies critical dimension and overlay registration tools to the semiconductor industry.
Product development included the most complete e-beam modeling undertaken for a CDSEM to create a unique design allowing for measurements as low at 100eV and to ensure outstanding long term stability and collection efficiency.
Programs for research and development in micro and nanoelectronics, CEA / LETI seeking to acquire equipment, CDSEM (Critical Dimension Scanning Electron Microscpy) to perform dimensional measurements can be less than 10 nm.