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DC/RF |
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When this new probe card technology is combined with Keithley's S600 Series parametric testers, the result will be single insertion DC/RF wafer measurements for automated process monitoring. The S510 Semiconductor Reliability Test System bridges the space between fully automated parametric test systems for production, such as Keithley's S680 DC/RF Parametric Test System, and semi-automated interactive bench top device characterization systems, such as Keithley's Model 4200-SCS Semiconductor Characterization System. NYSE:KEI), a leader in solutions for emerging measurement needs, today announced it has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Hynix Semiconductor, Inc. |
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