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DUT |
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Analysis tools, such as oscilloscopes, built-in error ratios test (BIST), or other analyzers can be used to monitor the behavior of the device under test under ideal and worst-case conditions. The PM300WLR is the first dedicated probe system for wafers up to 300mm that enables semiconductor manufacturers to quickly obtain critical results about the reliability of the device under test (DUT). A tool for laboratory environments, the Q-Master system uses ITU standard perceptual analysis to generate a Mean Opinion Score (MOS) that represents the end-user's perception of quality from the device under test. |
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