3 on silicon GDOES on low 110 150 108 105 roughness samples
After this preliminary approach, it was possible to state that the GDOES technique can hardly be correctly used to analyze the very rough magnesium alloy substrates.
Surface oxygen peaks are present in all GDOES graphs.
GDOES profiles proved to have a good reliability in ALD coating thickness evaluation on polished samples, showing data very close to those obtained by profilometric techniques.
Because no reference materials were present for amorphous ceramics, a specific GDOES calibration was required.
The distribution of species in the chromium layers was determined by depth-profiling using a LECO GDOES 750A instrument.
The depth-profiling of the chromating layer using GDOES shows a "multilayer" structure (Figs.
Chromate films were characterized using SEM and GDOES techniques showing continuous microcracks and changes in the chromate structure and consequent product performances with modifications in the chromating process (bath composition and rinses composition).