JTAG


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AcronymDefinition
JTAGJoint Test Action Group (developer of IEEE Standard 1149.1-1990)
JTAGJoint Test Advisory Group (US DoD)
JTAGJoint Technical Assessment Group
JTAGJoint Technical Advisory Group
JTAGJoint Technical Activities Group
References in periodicals archive ?
XJTAG Chain Checker identifies common errors in a JTAG scan chain, such as incorrectly connected and terminated test access ports (TAPs), and reports them to the developer.
The configuration of a JTAG debugging is consist of three parts ; JTAG Debugger Software in a host machine, JTAG probe and On chip debug(OCD) in SoC.
Testing DDR3 Memory with Boundary Scan / JTAG is available at asset-intertech.
8220;We believe this training can help forensic investigators who are interested in using JTAG to gather evidence or bypass PIN locks.
Designed specifically for Teradyne by JTAG, the solution with an advanced boundary scan test option is for manufacturers using the company's TestStation and GR228X family of In-Circuit Test systems, it said and added that two implementations of Symphony are supported by this collaboration for highest production test flexibility.
Flexible TestGenie packaging is available to facilitate an excessively large or complex PCB design, nonstandard test steps, board photographs, an alternative JTAG controller, and changes to the test procedure due to new UUT versions, revisions, or updates.
Use JTAG Technology that is now commonplace on many of today's digital and mixed signal designs.
Our strategic collaboration provides many benefits to the large community of PCB manufacturers who rely on boundary scan and Teradyne test equipment," said Peter van den Eijnden, managing director of JTAG Technologies.
Design teams working on system-level products assume the JTAG chain is functional.
The tool allows designers to easily incorporate their FPGA hardware directly into The MathWork's Simulink(R) tool using a JTAG interface.
Agilent's Infiniium Series is the first oscilloscope family to support JTAG triggering and protocol decode.
These cells can be programmed via the JTAG scan chain to drive a signal onto a pin and across an individual trace on the board.