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NbTiNational Bankruptcy Training Institute (US DOJ; Columbia, SC)
NbTiNational Bloodhound Training Institute (est. 1999)
NbTiNorthwest Bio-Technic, Inc. (British Virgin Islands)
NbTiNews by Teens International (website)
NbTiNegative Biased Temperature Instability
NbTiNational Blood Transfusion Institute (Belgrade, Serbia)
References in periodicals archive ?
via dipyridamole, NBTI or ENT1-s1RNA mediated knockdown) enhances anti-folate or 5-FU-induced cytotoxicity and anti-tumor activity (Smith et al.
While this is far from the chip operation condition (>GHz), it is used to provide information about the NBTI mechanisms which are still very much debated.
The multiplier is based on the variable-latency technique and can adjust the AHL circuit to achieve reliable operation under the influence of NBTI and PBTI effects.
The stabilizing solution in the current assay includes the nucleoside transport inhibitor NBTI, which also inhibits erythrocyte ATP release (8).
To determine the effect of NBTI during operation of a CMOS IC over a product's lifetime (typically a few years), NBTI degradation is measured under accelerated voltage-induced-stress conditions.
New Module Expands Agilent B1500A Capability for Emerging Ultrafast NBTI and Other Applications Requiring Fast Measurement
Series 2600 System SourceMeter instruments are ideal for a broad range of semiconductor reliability testing, including the challenges of scaled silicon reliability tests like NBTI (negative bias temperature instability.
For example, measurements requiring unprecedented measurement speeds such as on-the-fly NBTI can be made sequentially or in parallel with test plans at the device, wafer, or cassette level.
0 has also been enhanced to support fast parallel on-the-fly NBTI (negative bias temperature instability) testing.
Series 2600 SourceMeter([R]) Instruments feature TSP-Link([TM]) and Test Script Processor (TSP)[TM] for scalable I-V channel count systems, fast parallel measurements, and complex test sequences for applications such as on-the-fly NBTI or on-wafer component characterization.
An Accurate Lifetime Analysis Methodology Incorporating Governing NBTI Mechanisms in High-k/SiO2 Gate Stacks.