NEXAFS experiments were performed at the NIST beam line U7A at the National Synchrotron Light Source at Brookhaven National Lab.
Nine square samples (roughly 1 cm by 1 cm) were cut from positions in the plaques corresponding to those studied using NEXAFS.
Given the high surface specificity of the spectroscopies used here (~2 nm and ~5 [micro]m for NEXAFS and FTIR-ATR, respectively), however, even the finest depth discretization possible within the software cannot provide direct predictions of the experimentally measured surface orientation states.
FTIR-ATR and NEXAFS were utilized to map out the surface orientation distribution at nine representative centerline and off-center locations (Fig.
Thus, the azimuthal orientation angles measured via FTIR-ATR and NEXAFS are set at the moment when polymer molecules were first injected into the mold cavity.
10a; here, we select the NEXAFS data to represent the surface orientation state for comparison to bulk 2D-WAXS results).
this edge ( 50 eV above for NEXAFS to 1000 eV above for EXAFS).
The NEXAFS features are usually not as well understood as EXAFS, but NEXAFS is a very sensitive chemical probe for surfaces and non-crystalline materials.
To illustrate the angular sensitivity of NEXAFS, the S K edge NEXAFS of S passivated InP(100)-(1x1) surfaces were recently recorded on the DCM beamline to determine the S structural positions on the InP surface.
NEXAFS peaks near threshold often are much more sensitive chemically than competing techniques such as X-ray photoelectron spectroscopy (XPS).
Many S compounds give a basic triplet structure for the near-threshold NEXAFS, Fig.
Topics which will be explored in the first six sessions (Monday through Wednesday) include: spectroscopic applications in biochemistry and solids; surface studies through VUV absorption, NEXAFS
and PES; chemical imaging with soft X-ray microscopy; X-ray diffraction and scattering studies; chemical kinetics and dynamics; PES of gases and solids; and a variety of biological and materials research applications.