OBIRCH

AcronymDefinition
OBIRCHOptical Beam Induced Resistance Change
References in periodicals archive ?
1) Sample Preparation: Precision Grinding, Decap, Delayer, Laser cut (2) Physical construction analysis: OM, SEM, TEM, FIB, SRP, Optical Profiler, AFM (3) Elemental analysis: EDX, SIMS (4) Electrical failure analysis: EMMI, OBIRCH, ESD, Wire Bonding, Latch-up Test, CDM, Probe Station, Curve Tracer, IC Layout Image (5) Non-destructive inspection: X-ray, Acoustic Microscope (6) Intellectual property management (7) Academic workshop and seminar.