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TDDB

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AcronymDefinition
TDDBTime Dependent Dielectric Breakdown


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? References in periodicals archive
New models for NBTI and TDDB must be quickly developed early in the technology development cycle.
Keithley Introduces New Semiconductor Reliability Test System for ... by Business Wire
The SUSS PM8WLR ProbeShield(R) system is especially developed for extremely accurate, high-temperature multi-site WLR measurements, such as: electro-migration, TDDB, hot carrier, wafer level burn-in, life test and/or device characterization.
Innovative Multi-Site Wafer Level Reliability Test System is ... by Business Wire
The TDDB module is one of our newer product developments and was introduced and successfully installed in 2002 in a high current copper application.
Aetrium Announces Multiple Unit Order for 1164 Reliability Test ... by Business Wire
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