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6,826,298 for an Automated Wafer Defect Inspection System And A Process Of Performing Such Inspection which covers continuous inspection of wafers using strobing illumination. Rudolph Technologies (NASDAQ:RTEC) announced today it has provided an edge inspection tool to lithography system provider ASML Holding NV (ASML) (Euronext Amsterdam, NASDAQ: ASML) to help characterize wafer defects originating from process control issues at the wafer edge and accentuated by the immersion lithography process. KLA-Tencor (NASDAQ:KLAC) today introduced the eDR-5200, a new generation wafer defect review and classification system that leverages advances in resolution and defect re-detection sensitivity, along with unique connectivity with KLA-Tencor inspection systems, to enable better review performance, faster yield learning and higher productivity from both systems. |
Wafer Defect |
WAFCA WAFCS WAFD WAFD WAFD WAFD (FM) WAFD (FM) Wafd Party WAFDO WAFDOF Wafe Wafe WAFEC WAFEF Wafegine AutoLISP Collection wafer wafer wafer wafer wafer Wafer (cooking) Wafer (cooking) Wafer (cooking) Wafer Acceptance Test Wafer board Wafer cake Wafer Check Valve Wafer Check Valve Wafer Check Valve Wafer Chip Scale Package Wafer Defect Wafer Fab Cluster ManagementWafer Fabrication Equipment Wafer irons Wafer Level Burn-in and Test Wafer Level Camera Wafer Level Chip Scale Packing Wafer Level Packaging Wafer Level Reliability Wafer Level Reliability Baseline Wafer Level Reliability Testing Wafer Level Reliability Workshop wafer lever switch Wafer Operation Plan wafer phased array Wafer prober Wafer Probing Scheduling Problem Wafer scale integration Wafer scale integration wafer seal wafer seal wafer seal wafer seal wafer seals wafer seals wafer seals wafer seals Wafer Slip Abnormality wafer socket Wafer Starts Per Month Wafer Starts Per Week | |||||
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