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Series 2600 instruments enable scalable source-measure channel counts and high-speed testing for a variety of semiconductor test applications including wafer level reliability, on-wafer parametric die sort, and automated characterization. Meeting New Challenges in Wafer Level Reliability Testing The Active Vibration Cancellation technology employed in the EG6000e makes it uniquely suitable for raised test floors and sensitive long-term measurements such as in Wafer Level Reliability tests. |
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