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XRR
(redirected from X-ray reflectometry)

   Also found in: Wikipedia 0.01 sec.
AcronymDefinition
XRRX-Ray Reflectometry
XRRXML Registry/Repository (IBM Websphere)
XRRX-Responsive Region (biochemistry)


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Foster is known for his pioneering work on polymer interdiffusion and the development of X-ray reflectometry, neutron reflectometry and scanning probe microscopy techniques to study interfaces and adhesion.
The patented Meta-Probe X system employs a novel application of simple and reliable X-ray reflectometry (XRR) technology to independently measure thickness, density, and roughness of up to six (6) layers in production film stacks.
Based on X-ray reflectometry (XRR), a well understood and mature technology, the Meta-Probe X combines a patented approach for rapidly obtaining XRR data with a proprietary method for obtaining measurements from patterned wafers.
 
 
 
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