Acronyms

EBSD

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(redirected from Electron backscatter diffraction)
AcronymDefinition
EBSDElectron Backscatter Diffraction
EBSDEast Brunswick School District (New Jersey)
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References in periodicals archive
Characterization of the microstructure and texture of nanostructured electrodeposited NiCo using electron backscatter diffraction (EBSD).
One such technique is electron backscatter diffraction (EBSD), used in scanning electron microscopes (SEM).
Automated electron backscatter diffraction measurements have revealed both the extent of the elastic strain field in the neighborhood of an oxide growth front as well as the magnitude of elastic strain at any position in that field.
First presented are keynote lectures, followed by papers on deformation, including magnesium, severe plastic deformation, accumulative roll bonding and high pressure torsion, modeling, orientation gradient, experimentation research, and creep and superplasticity; deformation and annealing, including cube texture and thermo-mechanical processing; techniques, microstructure, dislocations, x-ray/neutron diffraction, recent advances, and electron backscatter diffraction measurements; annealing, with discussion of grain coarsening, recrystallization, and recovery; and materials, such as corrosion oxidation, interfaces, electrical steel, steel, titanium and zircaloy, phase transformation, shape memory, nano-structure materials, microstructural engineering, and non-metallic materials.
Electron backscatter diffraction detectors are used with scanning electron microscopes and energy dispersive spectrometers.
In collaboration with Sandia National Laboratory, NIST is developing procedures for analyzing the crystallographic phase of individual sub-200 nm particles utilizing electron backscatter diffraction (EBSD) in the field emission scanning electron microscope.
Unknown phases can then be identified automatically by matching the calculated patterns with the observed patterns generated using the electron backscatter diffraction technique, an increasingly popular scanning electron microscope-based technique used for the analysis of samples in materials science, geology, microelectronics and related research fields.
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