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CPB
(redirected from Charged particle beam)

    Also found in: Encyclopedia, Wikipedia, Hutchinson 0.03 sec.
AcronymDefinition
CPBCorporation for Public Broadcasting
CPBCardiopulmonary Bypass
CPBCentraal Planbureau
CPBConsumer Protection Board (State of New York)
CPBColorado Potato Beetle (Leptinotarsa Decemlineata)
CPBCommunist Party of Britain
CPBCentral Pacific Bank
CPBCommunist Party of Bangladesh
CPBClinical Policy Bulletin
CPBCharged Particle Beam
CPBCentral Planning Office (Dutch)
CPBCanada Premium Bonds
CPBCenter for Population Biology
CPBCoastal Patrol Boat (USCG)
CPBCenter for Practical Bioethics (Kansas City, MO)
CPBCalifornia Prune Board
CPBCoded Picture Buffer (digital TV)
CPBCorporation of the Presiding Bishop
CPBCivilian Personnel Bulletin
CPBCrime Prevention Branch
CPBConference Program Board
CPBCongress Parliamentary Board
CPBConducting Personal Business (on the job)
CPBCommunity Policing Bureau
CPBComputer Program Book
CPBCivilian Personnel Branch
CPBCareer Planning Board
CPBCritical Pressure Boiler
CPBComitato Pendolari di Bergamo
CPBConstant Prepayment on the Balloon
CPBConfiguration Policy Board


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? References in periodicals archive
FEI Company is a leading supplier of charged particle beam systems, including FIB systems, DualBeam systems, scanning and transmission electron microscopes, as well as components for the semiconductor, data storage, life sciences, and materials markets.
FEI Company Selects SRC Software's Advisor Series for Budgeting and ... by Business Wire
FEI Company (Nasdaq:FEIC) is a world leader in the design, manufacture, sale and support of charged particle beam systems and components including scanning and transmission electron microscopes (SEMs and TEMs) and focused ion beam (FIB) and DualBeam(tm) (FIB/SEM) systems.
Micron Force Instruments Bolsters Board of Directors by Business Wire
SELA, a manufacturer of automated SEM and TEM sample preparation systems for the semiconductor industry, today announced that it is partnering with FEI Company (Nasdaq: FEIC), a leading supplier of charged particle beam systems, to demonstrate a complete Transmission Electron Microscopy (TEM) sample preparation at the Microscopy & Microanalysis Expo.
FEI and SELA Partner to Provide Advanced TEM Sample Preparation by Business Wire
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