These challenges can crop up in various situations: for example, during boundary scan implementation on IC devices, wrong boundary scan description language
(BSDL) declaration that does not match the actual device, poorly designed PCBA test for boundary scan, or during implementation of the various boundary scan tools and integration to other manufacturing test strategies.
Boundary scan also has the capability to execute other tests, as defined in the BSDL (Boundary Scan Description Language
), including private instructions which support internal functions of a boundary scan device, such as built-in self-test (BIST).
Boundary scan description language
(BSDL) was developed as a subset and standard practice of VHDL.
Multi-core or multichip packages are also supported, provided each die has the corresponding BSDL (boundary scan description language
) that will permit the ATE software to determine the connection between devices.
* Boundary scan description language
(BSDL) files for each boundary scan component.