C-AFMConductive Atomic Force Microscopy
C-AFMCalibrated Atomic Force Microscope
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References in periodicals archive ?
The conductivity of the electrodeposited film was measured using two methods, the 4-point probemethod and C-AFM. The 4 point probe measures film surface conductivity and yielded an average value of 0.15 [+ or -] 0.06 S/m with very poor reproducibility.
C-AFM typically gives a much higher value of conductivity, often by a factor of 100 or more, than does the 4-point probe.
Figure 3 shows C-AFM topographic and current images of c-PAn/Si[O.sub.2](45%) and c-PAn films with a bias voltage of 3.0 V.