DSIMSDynamic Secondary Ion Mass Spectrometry
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Presentation topics will include: Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy (XPS), Chemical Imaging by Secondary Ion Mass Spectrometry (ToFSIMS), Chemical Characterisation of Layer Structure and Buried Interfaces by Dynamic Secondary Ion Mass Spectrometry (DSIMS), and Quantification of Surface Topography and Layer Thickness Measurement.
In their experiment, dynamic secondary ion mass spectrometry (DSIMS) was used to examine the dPS volume fraction ([phi]dPS) at the interface.
To overcome these limitations, planned future work will include other surface analytical tools, e.g., static secondary ion mass spectrometry (SSIMS) or dynamic secondary ion mass spectrometry (DSIMS) or laser microprobe mass analyzer (LAMMA).