FEGSEM

AcronymDefinition
FEGSEMField Emission Gun Scanning Electron Microscope
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Nomenclature NiO: Nickel oxide Ni: Nickel Ti: Titanium O: Oxygen Ti[O.sub.2]: Titanium oxide ZnO: Zinc oxide CuO: Copper oxide [In.sub.2] Indium oxide [O.sub.3]: ITO: Indium tin oxide Au: Gold SPT: Spray pyrolysis technique FEGSEM: Field emission gun scanning electron microscope EDX: Energy dispersive X-ray spectrometer XRD: X-ray diffractometer J-V: Current density-voltage I-V: Current-voltage [V.sub.oc]: Open-circuit voltage [J.sub.sc]: Short-circuit current density FF: Fill factor [P.sub.in]: Power in [P.sub.max: Maximum power.
Figure 5 shows the FEGSEM images of Ti[(OH).sub.4] and catalysts calcined at 300 to 500[degrees]C.
Caption: Figure 5: FEGSEM image of the Ti[(OH).sub.4] powder and the catalyst calcined at different temperatures for 1 h.
The results of the dispersion and intercalation/exfoliation of clay C30B in EPON828-D230 prepared by different pre-mixing methods are shown in Table 2 (results from X-ray diffraction (XRD) and field emission gun scanning electron microscopy (FEGSEM)).
Scanning electron microscope (SEM) observations were performed using a field emission gun SEM (FEGSEM) Hitachi S-4700.
A Hitachi-S4700 field emission gun scanning electron microscope (FEGSEM) was used to observe the dispersion of clay in the epoxy matrix at the micro-level with different magnifications of 1 k, 3 k, 10 k, and 40 k.
A field emission gun scanning electron microscopy (FEGSEM; Hitachi--4700) with the working operation voltage of 2 kV was used to observe the microdispersion of the samples.
The observation was made on a field emission gun scanning electron microscopy (FEGSEM; HITACHI S-4700), with the working operation voltage of 2 kV.
Apart from their nanodistribution, characterized by TEM and XRD analysis in a previous paper (23), the distribution of the clay particles in the materials at the micro-scale was also characterized by FEGSEM (Hitachi S4700) observations and image analysis.
Cross-sectional images of the final composite films were obtained using a Hitachi S-800 field emission-gun, scanning electron microscope (FEGSEM).