F/A

(redirected from Failure analysis)
Also found in: Wikipedia.
AcronymDefinition
F/AFailure Analysis
F/AFighter/Attack
F/AFuel/Air
F/AFlight Attendant
F/AFree Agent
F/AFuel Assembly
F/AFull Arc
F/AFluorescein Angiogramic Angiography
Copyright 1988-2018 AcronymFinder.com, All rights reserved.
References in periodicals archive ?
Due to iQor's initiatives in failure analysis and product handling, the refurbished video and broadband products have a higher quality than new units hitting the market.
Following the merger, TEDS will be responsible for product planning, product development, failure analysis and solution proposals for the semiconductor business, and will cooperate with TDSC as the engineering arm of its semiconductor business.
Failure analysis. PCBA contamination can be detected throughout electronics manufacturing, including the assembly process, test and long-term testing stages, and finished goods.
The range of services now offered by Schaeffler UK include condition monitoring using both online and patrol monitoring, vibration analysis, thermal imaging, bearing failure analysis, bearing mounting and dismounting, training and consultancy.
Similar approach was found suitable in this study to perform the failure analysis of Havelian Landslide by Slope/W software to investigate the variation of FOS with degree of saturation.
The Metallography Department at Lab Testing performs a wide range of Nadcap and A2LA accredited microscopic and macroscopic examinations, as well as microhardness testing, failure analysis and weld qualification.
[ClickPress, Tue Aug 04 2015] Failure Analysis Market by Equipment (SEM, TEM, FIB, Dual), Technology (SIMS, EDX, CMP, FIB, BIM, RIE), Application (Material Science, Bio Science, Industrial & Electronics), Geography - Forecast to 2020
By showing our students how to utilize humor in failure analysis, we can help instill a valuable habit of mind that they will carry with them throughout their lives.
Checkpoint Technologies, LLC has unveiled the InfraScan ES400C-LW for Testing and Failure Analysis. InfraScan ES400C-LW was developed to meet the demands of the newest lower power IC designs and architectures.
Jan was the lead author on the award-winning paper entitled: 'Clinical failure analysis of contemporary ceramic-on-ceramic total hip replacements', the co-authors being Trevor Gascoyne, Leah Guenther, Andrew Allen, Dr David Hedden, Dr Thomas Turgeon and Dr Eric Bohm.
As Wernher von Braun, the NASA rocket scientist, once said, "One test result is worth one thousand expert opinions." A failure analysis provides the sound scientific data needed to evaluate the problem.