GIXPSGlancing Incidence X-Ray Photoemmission Spectroscopy
Copyright 1988-2018, All rights reserved.
References in periodicals archive ?
The project is developing high-resolution transmission electron microscopy (TEM) analysis methods, comparing existing particle analysis methods with new approaches, developing variable angle grazing incidence x-ray photoelectron spectroscopy (GIXPS) technology, and applying these methods to real analytical problems via industry collaborations.