HAADF

AcronymDefinition
HAADFHigh-Angle Annular Dark Field
HAADFHigh-Angle Annular Detector Dark-Field
References in periodicals archive ?
(Left) HAADF STEM image with red arrow indicating location and direction of line scan.
The author is also very much indebted to Schaefer Technologies for making the Alicona Infinite Focus images and to the Fraunhofer institute for sharing their STEM HAADF high-resolution images.
A higher magnification HAADF image acquired from the rectangular area outlined in Fig.
Caption: FIGURE 1: 200 keV cross-sectional HAADF STEM images of (a) ITO160 and (b) IT[O.sub.2]2 covered by a protective Pt-layer.
In STEM image the high angle annular dark field (HAADF) detector has the advantage to create a Z-contrast image.
The topics include recent developments in gas cell technology, the use of Aduro in combination with JEOL TEM/SEM and the use of Poseidon for elemental mapping and HAADF imaging.
These results suggest that HAADF intensity image histograms are somehow sensible to sheet dispersion.
The nanoanalytical and structural investigations of the rapidly quenched Nd-Fe-B permanent magnet materials have been carried out with an analytical field emission transmission electron microscope (TEM) (FEI Tecnai F20) at 200 kV, which is equipped with a silicon drift energy dispersive X-ray (EDX) detector, a Gatan GIF Tridiem image filter and electron energy loss spectrometer (EELS) and a high angle annular dark field (HAADF) detector.
Scanning transmission electron microscopy (STEM) images were obtained with a high angle annular darkfield (HAADF) detector (Z contrast).
Figures 2(f) and 2(g) illustrate the difference between the HRTEM and the HAADF and show the difference of electronic density between the Pt NPs and the bone powder support.
Transmission electron microscope with a 200 kV field emission source of, energy filter, two, HAADF STEM detectors and 4k x 4k CMOS camera.
The nanoanalytical and structural investigations of the heavy RE-free sintered and rapidly quenched (Pr,Nd)-(Fe,Co)-B permanent magnet materials have been carried out with an analytical field emission transmission electron microscope (TEM) (FEI Tecnai F20) at 200 kV, which is equipped with a high angle annular dark field detector (HAADF), a silicon drift energy dispersive X-ray detector (EDX), and a Gatan GIF Tridem image filter and electron energy loss spectrometer (EELS).