For example, an NBT test strategy might include boundary scan test, PCT, and a BIST technique such as IBIST. These nonintrusive technologies rely on embedded instrumentation within silicon to deliver test coverage.
IBIST, a third NBT technique, is a proprietary implementation of BIST that is being embedded into next-generation chips and chip sets by Intel, Avago, and other semiconductor and IP providers.
IBIST is particularly useful on high speed serial buses like QPI and PCle.
Because IBIST is another at-speed nonintrusive technology, it can detect faults and failures that typically would pass low-speed static tests, such as those applied by ICT or boundary scan.
NBT technologies like boundary scan, PCT, and IBIST take up only a small subset of the available XDP signals.