The fault simulation results show 96.34% fault coverage that could be improved to achieve 100% by including additional
IDDQ testing.
The
Iddq analysis in Nassda's HSIM provides low-power designers the information they need to optimize the performance of their designs.
High-voltage
IDDQ, a test method in which supply current is monitored, is also used to eliminate burn-in testing.
(3.) Power Consumption Testing Technical Details (IDD,
IDDQ), National Instruments, Example Program, Nov.
Lombardi, "
IDDQ testing of bridging faults in logic resources of reconfigurable field programmable gate arrays," IEEE Transactions on Computers, vol.
Starting at the circuit board assembly, traditional stuck-al logic tests, shorts and opens, algorithmic memory tests, and
IDDq current tests are applied.