JCPDSJoint Committee on Powder Diffraction Standards
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When the reaction time was longer than 15 h, all the diffraction peaks can be readily indexed as a pure orthorhombic well-crystallized [Bi.sub.2]W[O.sub.6] structure of the JCPDS number 73-1126 [18].
At the same time, the 2-theta data of CIGS-3 is also close to that on the JCPDS card (40-1488) for Cu([Ga.sub.0.5][In.sub.0.5])[Se.sub.2.0].
A SAED pattern shows diffraction rings of the polycrystalline rod-like SrSn[(OH).sub.6] precursors corresponding to the (301), (222), (512), and (441) crystallographic planes of the JCPDS database number 09-0086 [16].
Films A and B only exhibited the peaks of monoclinic W[O.sub.3] phase, while the film C crystallized into a combination of monoclinic W[O.sub.3] (JCPDS 43-1035) and [W.sub.18][O.sub.49] (JCPDS 36-0101) phases.
However as the calcination temperature increases from 600 to 700[degrees] C, a rutile peak at 43.68[degrees] is detected and is in good agreement with standard JCPDS file number 021-1276.
For the S1, all diffraction peaks can be indexed to be cubic phase of [Cu.sub.2]O crystal (JCPDS number 05-0667).
Here I is the observed relative intensity with respect to the most intense diffracting plane and Io is the standard relative intensity for (h k l) planes obtained from the JCPDS Card No.
The diffraction pattern was in good agreement with the JCPDS card of ZnS (JCPDS no: 01-072-4841) [30].
Our data is in agreement with that of JCPDS card number 36-1451 [1].
Comparison of the experimental X-ray diffraction pattern with the JCPDS card showed that the Cd[In.sub.2][O.sub.4] and Cd[In.sub.2][O.sub.4]:[Er.sup.3+] crystals have a cubic crystal structure.
XRD data shows that synthesized powders are comprised of tetragonal CIS materials (JCPDS card number 040-1487).
For Si/C composite, there only exist the crystalline diffraction peaks of nano-Si (JCPDS No.