KPFMKelvin Probe Force Microscopy
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Surface voltage measurements were done with the Kelvin Force probe (KPFM) using a NT-MDT atomic force microscope (AFM) in atmospheric conditions.
As already stated, KPFM is a suitable technique to probe the local contact potential difference at a film surface.
Figure 4 shows KPFM topography and contact potential CP histogram acquired at a distance of 30 nm with an Ac voltage of 3V between the surface and the cantilever during the second pass.
It is worthwhile to note that the KPFM measurements conducted in this study have been made in air, so the obtained values are rather qualitative [57].
Finally, KPFM emerged as a powerful local technique to determine, in ambient conditions and in a fast way, the work functions of multilayer systems.
Cai, "Label-free detection of the aptamer binding on protein patterns using Kelvin probe force microscopy (KPFM)," Analytical and Bioanalytical Chemistry, vol.
“Our new PeakForce KPFM mode combines leading-edge spatial resolution with unprecedented sensitivity and accuracy in work function measurements.”
“To enable this advance, we are building on our exclusive PeakForce Tapping technology with PeakForce QNM[R], PeakForce TUNA[TM], and now PeakForce KPFM.”
The PeakForce KPFM accessory is an optional addition available for the Dimension Icon[R] and MultiMode[R] 8 AFMs.