LVSEMLow Voltage Scanning Electron Microscopy
LVSEMLow Vacuum Scanning Electron Microscopy
Copyright 1988-2018, All rights reserved.
References in periodicals archive ?
Image analysis of LVSEMs of ruthenium tetroxide-stained blend specimens showed that 0.5-micron dispersions of plastomer particles were produced in the low-flow and medium-flow PPs.
Scanning electron microscopy (SEM) images were performed using a JSM-5610 LV (LVSEM) at 10.0 kV.
They were observed using JOEL JSM-6390 LVSEM at a rating voltage of 15-20 kV at different magnifications as indicated on the SEM images.