(redirected from Line Edge Roughness)
LERLesão por Esforço Repetitivo (Portuguese: Repetitive Strain Injury)
LERLabel Edge Router
LERLong Eye Relief (optics)
LERLaw Enforcement Ranger
LERLebensgestaltung Ethik Religionskunde (German: Design life of Ethics Religious Studies)
LERLeast Error Rate
LERLink Error Rate
LERLevel Error Rate
LERLine Edge Roughness (semiconductor fabrication)
LERLand Equivalent Ratio
LERLuminaire Efficiency Rating (lighting)
LERLuminaire Efficacy Rating
LERLight Emitting Resistor (a resistor burning up)
LERLicensee Event Report
LERLeaf Elongation Rate (botany)
LERLicensing Economics Review (newsletter)
LERLabyrinth Excluder Ring (engineering)
LERLauncher Equipment Room
LERLoss Exchange Ratio
LERLocal Equipment Room
LERLuminous Electronics Recycling, Inc (Denver, CO)
LERLanguage Equivalence Relations
LERLocal Electrical Room
LERLaboratoire d'Etude de Radiopharmaceutiques (French)
LERLand, Easement, and Right of Way
LERLANSCE/Energy Research Program
LERLaboratorium voor Ecologische Risicobeoordeling
LERLepidoptera of Eretna State
References in periodicals archive ?
techniques to model Line Edge Roughness (LER) variation in the spacing between wires on a chip, which impacts voltage;
These differences are considered small enough that they may be accounted for by line edge roughness and uncertainty in matching the location of the cross section to the location of the CD-SEM image.
Using a unique column design and innovative new algorithms, PVM technology enables increasingly vital measurements to be made on the device, including line edge roughness, line edge width variation, and distinguishing open/closed contact holes.