MBIST

AcronymDefinition
MBISTMemory Built-in Self Test
References in periodicals archive ?
The memory BIST (MBIST) includes test algorithm programmability and the capabilities to execute test at the functional speed of the design and change memory-timing parameters such as the self-timed clocks (Figure 1).
The memories included the additional circuitry to perform the MBIST functionality and the PLLs for at-speed test.
Improving yield with retooling and robust infrastructure
Failure analysis is based primarily on data from scan chains and memory bit maps (from mBIST engines).
Trends in failure analysis techniques: defect correlation analysis is a new approach in IC failure analysis technology
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