MBISTMemory Built-in Self Test
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The memory BIST (MBIST) includes test algorithm programmability and the capabilities to execute test at the functional speed of the design and change memory-timing parameters such as the self-timed clocks (Figure 1).
The memories included the additional circuitry to perform the MBIST functionality and the PLLs for at-speed test.
Failure analysis is based primarily on data from scan chains and memory bit maps (from mBIST engines).