The comprehensive detection techniques offered by the MBIST
Full-Speed(TM) feature, the MBISTArchitect tool's at-speed testing capability, in combination with the versatile memory test algorithms, including the MBIST
Flex(TM) user-definable algorithm feature, ensure subtle defects are identified and corrected by replacing them with redundant cells.
Faraday can select from a set of pre-defined industry-standard algorithms, such as March C and checkerboard, or the tool's own MBIST
Flex(TM) user-definable algorithm which applies at-speed tests with flexible pattern applications to detect technology specific defects.
Mitel's ASIC System CMOS Design Kit includes the following tools: from Cadence Composer, Verilog-XL, Leapfrog, Veritime, Verifault, Pearl; from Mentor, Design Architect, QuickSim, QuickPath, QuickFault, ModelSim, SSTVelocity, DFT Architect, FastScan, FlexTest, BSDArchitect, MBIST
, LBIST, AutoLogic; from Synopsys, Design Compiler, Power Compiler, Test Compiler, Design Power, TestGen, PrimeTime, VCS, VSS; from LogicVision, icBIST, LogicBIST, tapBIST, memBIST; and from Mitel, Universal Delay Calculator, Paracell Model Generator, Test Pattern Verifier.