PXRDPowder X-Ray Diffraction (also seen as PXD)
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Powder X-ray diffraction (PXRD) analyses were obtained on a Philips PW 1710-BASED diffractometer at 293 K.
X-ray diffraction (PXRD) data suggested crystalline nature for the pure ligand and its corresponding complexes and this observation is well supported by morphological characterizations performed using Scanning Electron Microscopy.
As depicted in Figure 1(a), all diffraction peaks of PXRD are well matched to the simulated ones from SCXRD analysis, indicating the highly pure single-crystal structure of as-prepared CGSe.
1a before and after the 5-Fu entrapping were characterized by PXRD. The concentration of 5-Fu in the supernatant was determined by the absorbance of 5-Fu at 265 nm with the help of a calibration curve.
PXRD measurement and TG-DTA measurement suggested inclusion complex formation in FD (MT/[alpha]CD) and FD (MT/[gamma]CD).
The powder X-ray diffraction (PXRD) pattern of the DOX@ZIF-8 nanoparticles is shown in Figure 1(c).
The PXRD demonstrated that these nanocrystals were ZIF nanocrystals (Figure 4(c)), while the FTIR spectra demonstrated the successful loading of FITC and the formation of ZIF in FITC/HMS@ZIF (Figure 4(d)).
Results of DSC and PXRD suggested complex formation in EVP2 (ASCP/UR at a molar ratio of 1/12).
In order to determine the purity of these minerals, Powder X-ray Diffraction (PXRD) was conducted with a PANalytical X'Pert Pro Multipurpose Diffractometer (MPD) with Cu Ka radiation ([lambda] = 1.54 [Angstrom]) and a proportional counter detector equipped with a flat graphite monochromator.
The nanoparticles of CdO obtained by the thermal decomposition of bis(2-hydroxy-1-naphthaldehydato)cadmium(II) complex in HDA at various temperatures (120,160, and 200[degrees]C) were analyzed by UV-vis, PL, pXRD, and TEM.