SPLEEMSpin-Polarized Low-Energy Electron Microscopy
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Electron and force based magnetic microscopy such as magnetic force microscopy (MFM), Lorentz force microscopy (LFM), photoemission electron microscopy (PEEM), spin polarized low energy electron microscopy (SPLEEM), scanning electron microscopy with polarization analysis (SEMPA), spin polarized scanning tunneling microscopy (SP-STM), electron holography, and ballistic electron magnetic microscopy all provide excellent spatial resolution, but offer very poor or moderate temporal resolution.