STIL (
Standard Test Interface Language) and WGL (Waveform Generation Language) are industry-standard languages used by Automatic Test Program Generators (ATPG) and Design for Test (DFT) tools to specify test patterns for IC devices.
This tool enables the use of waveform generation language (WGL) and
standard test interface language (STIL) patterns with NI high-speed digital instruments."
The newly created and expanded working groups are centered on portable test instrument module (PTIM), yield enhancement and the
standard test interface language (STIL).
The TSSI TD-Scan for NI software, a collaboration between NI and Test Systems Strategies, imports Waveform Generation Language (WGL) and IEEE 1450
Standard Test Interface Language (STIL) simulation vectors into PXI systems.
They join the STC working groups already focused on hardware docking, probe cards,
Standard Test Interface Language (STIL), and joint industry-university research projects.
Although the IEEE 1450.0
Standard Test Interface Language (STIL) was adopted in March 1999, widespread industry acceptance was quite slow.
