TOF-SIMSTime-Of-Flight Secondary Ion Mass Spectroscopy (manufacturing measurement/analysis tool)
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In comparison to former investigations the present article concentrates firstly on the main advantages of TOF-SIMS technology: the detection of nearly all inorganic and organic molecules with very high detection sensitivity and up to high molecular weights.
The surface chemistry and topographical changes in cotton surface were studied using FTIR, SEM, XPS, and TOF-SIMS.
TOF-SIMS is an accurate and efficacious technique applicable to different types of system surfaces.
The experiment was a combination of mixed flowing gas to create creep corrosion and TOF-SIMS to identify the corrosion product.
It may be attributed to additive surface alignment provided by TOF-SIMS.
The TOF-SIMS imaging mode of operation was used to obtain information about the lateral distribution of the surface contaminants.
Analytical capabilities include, SIMS, TOF-SIMS, TXRF, XPS, AES, AFM-STM and SRP.
Rupert Smith, product manager at Scanwel, added, "Nanomechanics is an excellent fit to the Scanwel portfolio of leading surface analysis products, which already includes XPS, probe microscopy, nano-Infrared spectroscopy and TOF-SIMS.
The paper reviews several ex-situ analytical tools, such as AES, RBS, SIMS, SEM, SIMS, TXRF, TOF-SIMS, XPS, used in today's high technology industries.
The team also has access to some unique facilities at the University of Toronto including TOF-SIMS, XPS, FE-SEM, and XRD - these additional facilities cost many millions of dollars.
TOF-SIMS, of course, refers to the time-of- flight detector being used.
TRIFT II TOF-SIMS, for time-of-flight secondary ion mass spectrometer, is a second-generation TOF-SIMS instrument from Physical Electronics, Eden Prairie, Minn.