TOF-SIMS

(redirected from Time-Of-Flight Secondary Ion Mass Spectroscopy)
AcronymDefinition
TOF-SIMSTime-Of-Flight Secondary Ion Mass Spectroscopy (manufacturing measurement/analysis tool)
References in periodicals archive ?
Time-of-flight secondary ion mass spectroscopy (TOF-SIMS) is an important analytical technique for the semi-quantitative characterization of materials at a molecular level.
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