UNHTUltra Nano Hardness Tester
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Product name: CSM Instruments Ultra Nanoidentation Tester (UNHT) Attributes/comments: The UNHT corresponds to a high resolution Nanoidentation system with extreme accuracy and extremely low thermal drift.
The CSM Instruments' Ultra Nanoindentation Tester (UNHT) (0-50 mN) is a high resolution Nanoindentation system with high accuracy and low thermal drift.
The thermal drift of the UNHT has already been shown to be almost negligible over long periods of time (typically 1 to 2 nm over 10 minutes on fused Si) which means that material creep can be monitored with more accuracy.