WDXRF

AcronymDefinition
WDXRFWavelength Dispersive X-Ray Fluorescence
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The abundance to intensity correlation of the model compound mixtures is compared with WDXRF spectrum of other WDXRF spectrum of interest that have been processed by the WOMBAT methods.
The popularity of WDXRF and EDXRF techniques for sulfur analysis have made them the most competitive sector of the market.
5039 describes the analysis of unused lubricating oils and additives for a variety of inorganic elements following ASTM method D6443-04 using the company's Supermini200--a benchtop WDXRF spectrometer.
Wavelength-dispersive X-ray Fluorescence Spectrometer (WDXRF): WDXRF is used to identify and measure the bulk elemental composition of solid materials.
The WDXRF Portaspec X series benchtop model X-ray analyzer performs multi-elemental analysis in the range of Ti to U and is suited for measuring coating weights of both chrome and titanium pretreatment, as well as zirconium pretreatment.
WDXRF is a well-established elemental analysis technique used in many process, quality control, and research applications.
As a high-power (air-cooled 50-kV, 200-W X-ray tube) benchtop sequential WDXRF spectrometer system, the Supermini delivers rapid, high-sensitivity, non-destructive analysis of elements from fluorine through uranium in solids, liquids, powders and thin films.
As the world's first high-power (air-cooled 50-kV, 200-W X-ray tube) benchtop sequential WDXRF spectrometer system, the Supermini delivers rapid, high-sensitivity, nondestructive analysis of elements from fluorine through uranium in solids, liquids, powders and thin films.
2] footprint, the ARL OPTIM'X WDXRF spectrometer features proprietary XRF technology and fully automated sample preparation and analysis.
The WDXRF Portaspec X Series benchtop model 2501XBT performs multi-elemental analysis in the range of Ti to U.
Mandatory technical parameters of the device, which must be strictly complied with (technical specifications): - sequential X-ray fluorescence spectrometer operating on the principle of dispersion wavelength WDXRF - stapiarka min.
These instruments include the EDXRF benchtop MiniPal 4 system for quick pre-screening, the polarized EDXRF spectrometer Epsilon 5 for the low-level determination of heavy metals, and Axios advanced WDXRF systems for precise quantitative analysis of bulk raw materials in process and quality control applications.