WD

(redirected from Wafer Defect)
AcronymDefinition
WDWestern Digital
WDWidth
WDWord
WDWalt Disney
WDWasher & Dryer
WDWestern Digital (storge solutions)
WDWorking Draft
WDWheel Drive
WDWood
WDWestern Economic Diversification Canada (Canada)
WDWeb Design
WDWar Diary
WDWhite Dwarf
WDWithdrawn
WDWatford (UK postal Code)
WDWeb Developer
WDWell Done (net games)
WDWind Direction
WDWiring Diagram
WDWrite Down
WDWater Displacement
WDWaste Disposal
WDWeb Directory
WDWar Department
WDWheeler Dealers
WDWorking Day
WDWinn Dixie (grocery store chain)
WDWell-Dressed
WDWithout Doubt
WDWound Debridement
WDWatch Dog
WDWater Depth
WDWestern Division
WDWarranty Deed
WDWilson Disease
WDWorking Dog
WDWatership Down (novel)
WDWebster's Dictionary
WDWater Division
WDWater Deficit (agriculture)
WDWoody Debris
WDWhirling Disease (Rainbow Trout disease)
WDWide Differential (SCSI)
WDWeibull Distribution
WDWhen Discovered (Nalcomis)
WDWeapons Director
WDWeapon Data
WDWet Dock (DD3)
WDWrist-Disarticulation (amputation)
WDWireless Directive (US DoD)
WDWestminster Dragoons (UK Territorial Army)
WDWafer Defect(s)
WDWord Displacement
WDWeak Dipole
WDWorld Devastator (Star Wars)
WDWarm Dielectric (high temperature superconducting cables)
WDWestern Economic Development Canada
WDWet/Dry Index
WDWDS Processing (Tartar Module)
WDWord Disparity
WDWorld Domination Recordings (Capitol Records)
WDWeekend Dykes
References in periodicals archive ?
Designed for characterization and monitoring of the diverse processes used in wafer-level packaging, CIRCL-AP enables all-surface wafer defect inspection, review, and metrology at high throughput.
has received an order from a leading bumping facility in Taiwan for its new 3Di-8000, a complete system integrating 100% 2D and 3D bump and wafer defect inspection.
For example, working with a major semiconductor manufacturer in the United States, Tamar has developed and deployed a wafer defect detection system for inspecting macro defects of 5 [micro]m on ultrathin patterned wafers for post-fab use (Figure 1).
During chip development, this suite of detection technologies helps find the wafer defects that most immediately threaten yield, accelerating the identification of design issues that reveal the need for mask design.