(redirected from White Light Interferometry)
Category filter:
WLIWeblogic Integration (Bea Systems)
WLIWeb Logic Integration
WLIWeekly Leading Index
WLIWaiting List Initiative (various locations)
WLIWhole Life Insurance
WLIWorking Lands Initiative (various locations)
WLIWhite Light Interferometry
WLIWang Laboratories Inc.
WLIWork List Item
WLIWellness Layers, Inc. (East Rockaway, NY)
WLIBuoy Tender, Inland (USCGC)
WLIWork Load Indicator
WLIWorld Learning Incorporated
WLIWebLogicInfotech (India)
WLIWhere Lines Intersect
WLIWilliam Law Institute
Copyright 1988-2018 AcronymFinder.com, All rights reserved.
References in periodicals archive ?
Die plug analysis, chloroform washing of the co-PET layer and white light interferometry were used for experimental validation of CFD results.
For final film interpretation, the co-PET thickness values were compared with both the white light interferometry thickness values and the CFD co-PET flow values.
Wyant, "White light interferometry," in Holography: A Tribute to Yuri Denisyuk and Emmet Leith, vol.
The contours formed by white light interferometry allow Bruker testers to determine whether surface damage consists of pits, scratches, spirals, etc.
Examining devices by the nanometer, which is one-billionth of a meter, is one thing, but scientists at Bruker can drill down to the angstrom level--one ten-billionth of a meter--with white light interferometry. Thus, Bruker is able to avoid getting slowed down by the slicker polymers and more resistant materials taking longer to show wear.
Key words and phrases : White light interferometry, Surface profiling, Optimal characteristic of optical filter, Quadrature sampling, Second-order sampling
Vertical-scanning white light interferometry is a widely used technique of profiling the surface topography of objects such as semiconductors, liquid crystal displays (LCDs), and so on.
Using white light interferometry and a precision motorized stage, the NanoMapper can create 3-D nanotopology wafer maps with unmatched height resolution and stitch them together for an expanded field of view.
Zygo Corp., Middlefield, CT, has incorporated its MetroPro analytical software for scanning white light interferometry into New View 100, its 3-D imaging surface structure analyzer.