XEDSX-Ray Energy Dispersive Spectroscopy
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The size and morphology of the samples were observed using high-resolution transmission electron microscopy (HRTEM, JEM-2010) coupled with an X-ray energy dispersive spectroscopy (XEDS) accessory to the chemical composition of the products.
In order to determine the composition of the samples, the energy dispersive Xray energy dispersive spectrometry (XEDS) of [Zn.sub.1-x][Ni.sub.x]S nanorods was performed.
Compared with paramagnetic behavior of pure ZnS, the origin of the observed ferromagnetic properties of Ni doped ZnS samples is mainly due to the substitution of [Ni.sup.2+] on [Zn.sup.2+] sites not due to Ni cluster or its metal oxides, proved by the XEDS and XRD studies; no such secondary phases have been observed.
The chemical composition of the products was verified by X-ray energy dispersive spectroscopy (XEDS) at an acceleration voltage of 200 keV in TEM.
In order to confirm the existence of the Cr elements of the doped samples, XEDS analysis is recorded.
Sample Magnetic moments (emu/g) Band Saturation gap (eV) magnetization Pure ZnS 3.729 0.0117 [Zn.sub.0.99][Cr.sub.0.01]S 3.737 0.0111 [Zn.sub.0.97][Cr.sub.0.03]S 3.743 0.0097 [Zn.sub.0.95][Cr.sub.0.05]S 3.732 0.0105 Sample Magnetic moments (emu/g) Remanent Coercivity magnetization (Oe) ([10.sup.-4]) Pure ZnS 6.415 46.71 [Zn.sub.0.99][Cr.sub.0.01]S 5.122 40.26 [Zn.sub.0.97][Cr.sub.0.03]S 5.339 41.22 [Zn.sub.0.95][Cr.sub.0.05]S 5.376 42.74 FIGURE 4: XEDS patterns of pure ZnS (a) and [Zn.sub.0.95][Cr.sub.0.05] S (b).
High resolution transmission electron microscopy (HRTEM) and X-ray energy dispersive spectroscopy (XEDS) analyses have been carried out to study the morphology, grain size, and chemical composition using a JEOL JEM 2100.