XTEMCross-Sectional Transmission Electron Microscopy
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The cell thickness was fixed at 2.1 [mmicro]m as it was measured from XTEM. The rear surface recombination velocity was found to have a negligible effect on the modelling results, indicating that surface passivation was not important for the investigated cell performance [36].
Deeper spikes are easier to form in the VPE cells with vertical grain boundaries as shown in XTEM images than in the SPE cells with the noncolumnar structure.
A cross-section of HA/Ti interface was prepared by ion millin[g.sup.33] by cross-section transmission electron microscopy (XTEM).